PITCON 2002 NeSSI Open Session

March 20, 2002
Room 235, Morial Convention Center
1:30 - to about 4:00 PM

Program Session 238: User-Manufacturer Information Exchanges (UMIX)

New Sampling/Sensor Initiative (NeSSI) Information Exchange

1:30

 Introductory Remarks -- JAMES F. TATERA (Announcement flyer)

1:35 

 (2332) New Sampling/Sensor Initiative Concept and Draft Specification
ROBERT F. DUBOIS, Dow Chemical Canada Inc, Peter van Vuuren, James F. Tatera

2:35 

 (2333) Surface Mount Technology for Sample Conditioning Systems
STEVE DOE, Parker Hannifin Corporation

2:50 

 (2334) Miniature Modular Sample Systems - From Concept to Reality
DAVID M. SIMKO, Swagelok Company

3:05

 Recess

3:20 

 (2335) Vendor/User Inputs Workshop
JAMES F. TATERA , Robert F. Dubois, Peter van Vuuren

Workshop Topics:

NeSSI as Potential Platform for Micro-Analytical Sensors

Sampling Requirements for Micro-Analytical Devices (MADs)

Opportunities to apply NeSSI as a MAD Sampling Platform
Sensor/Actuator Communications

To CAN or NOT (CAN-bus to the rescue?)

Charter for C-Team (Connectivity Team)
SAM, A Sensor and Analytical Manager happy to do the Routine Sampling System Tasks

What should SAM be doing  (Applets Concept)

Who should SAM be talking to 

Notes from workshops

4:00 Adjourn

If you can’t attend, but want to learn more about NeSSI, please check out the NeSSI portion of the CPAC web site at  www.cpac.washington.edu/NeSSI/NeSSI.htm