January 22, 2003 |
IFPAC 2003 |
Wed PM-II Session |
Session Chair: Peter van Vuuren, ExxonMobil Chemical Company, Engineering, Baytown, Texas
| 1:10 | NeSSI: The Good, the Bad and the
Ugly -Early Implementations and Directions
Rob Dubois - Dow Chemical Canada Inc., Fort Saskatchewan, AB, Canada; John Cumbus |
| 1:35 | NeSSI Generation I
- A Solid Foundation
Douglas A. Nordstrom, David M. Simko, John J. Wawrowski |
| 2:00 | Between SAM and the Substrate
- A Smart Valve for NeSSI
Richard A. Ales |
| 2:25 | Networked Sampling System
(NeSSI-Generation II) Developmentand Field Test
J.Mosher, R.Nickels and U.Bonne, Honeywell International - ACS |
| 2:50 - 4:00 | Break - Allow attendees to participate in the Grand Opening of the Exhibition |
| 4:00 | Microelectromechanical Systems
for Process Analytics
Berthold Andres |
| 4: 25 | PHASED, a Faster, Smarter and
More Affordable Gas Analysis Device - Update
U.Bonne, J.Detry, R.Higashi, K.Newstrom-Peitso, H.Pham, T.Rezacheck and S.Swanson Honeywell Labs, Plymouth, MN |
| 4:50 | Low Water levels in
various solvents: on-line monitoring by a Miniature MIR Spectrometer
Joseph P Sung |
| 5:15 | Computational Fluid Dynamic(CFD) Analysis
of Gas and Liquid Flow Through a Modular Sample System
Tanios Y. Bougebrayel |
| 5:40 | Surface Mount Technology Update
- 2003 Steve Doe |
| 6:05 | Adjourn |
Room 1A, Topics: