Abstract:
A simple but quantitative mathematical formalism for interpretation of surface plasmon resonance (SPR) signals from adsorbed films of a wide variety of structures is presented. It can be used to estimate adsorbed film thicknesses, surface coverages, or surface concentrations from the SPR response over the entire range of film thicknesses without relying on calibration curves of response versus known thicknesses or surface concentrations. This formalism is compared to more complex optical simulations. It is further tested by (1) calibrating the response of two SPR spectrometers to changes in bulk index of refraction, (2) using these calibrations with this formalism to predict responses to several well-characterized adlayer structures (alkanethiolates and serum albumin on gold, propylamine on COOH-functionalized gold), and then (3) comparing these predictions to measured SPR responses. Methods for estimating the refractive index of the adlayer material are also discussed. Detection limits in both bulk and adsorption-based analyses are discussed. The planar system used here has a detection limit of similar to 0.003 nm in average film thickness for adsorbates whose refractive index differs from that of the solvent by only 0.1. The temperature sensitivities of these two SPR spectrometers are characterized and discussed in terms of detection limits.

Addresses:
Campbell CT, Univ Washington, Dept Chem, Seattle, WA 98195 USA.
Univ Washington, Dept Chem, Seattle, WA 98195 USA.
Univ Washington, Dept Elect Engn, Seattle, WA 98195 USA.

Publisher:
AMER CHEMICAL SOC, WASHINGTON

IDS Number:
121RC

ISSN:
0743-7463